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Ioannis Delakis obtained his first
degree in Physics at the University
of Athens, Greece in 1997,
followed by an MSc
in Engineering and Physical Science in Medicine
at Imperial College, London.
His interest in medical imaging started
with an internship in the Greek Atomic Energy Commission researching
the quality of x-ray imaging and expanded with an MSc project
in MRI.
He recently completed a PhD on developing
a quality assurance and comparative test for MRI scanners,
focusing on functional imaging of the brain (neuronal activation
cartography, diffusion and perfusion imaging).
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